MICRO-KLEPS

0.64 mm system / Clamp-type test probe

  • MICRO-KLEPS
  • MICRO-KLEPS
  • MICRO-KLEPS
CE
Product MICRO-KLEPS
description Miniature clamp-type test probe with rotating grip jaws (SMD technology). The insulated shaft can be bent up to 35º. Suitable for very thin wires and densely packed contact points (1.27 mm IC spacing pitch). Connects with MKL... and MAL...
operating instruction BA002
article-no. /
*colour
9739721xx

0001
blackred
drawing
MICRO-KLEPS
technical data
connection 2 x unsprung pin Ø 0.64 mm
rated voltage(1) 30 VAC / 60 VDC
measurement cat. acc. to IEC 61010 O (3)
rated current(1)
(consider derating curve)
2 A
material plug brass, gold plated
housing material PBT
temperature range acc. To IEC61010(2) -25 °C to +70 °C
inflammability class acc. to UL 94
(only valid for basic material of housing)
HB
clamp type rotating grip jaws, tin plated
clamping range 1,6 mm
standard IEC 61010

(1) for normal environmental conditions -5°C to +40°C
(2) contact the manufacturer for applications at deviating temperature ranges
(3) without rated measurement category, for other circuits that are not directly connected to mains

stand: 10.01.2019
x

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